元件失效 component failure
- 本文以大量的可靠性试验统计数据为基础,分析了和论述了我国阻容电子元件的筛选技术、可靠性评价及失效机理。
On the large number of reliability test statistic data, the selection technology, reliability evaluation and failure mechanism of RC electronic components are analysed and discussed. - 但是这离计算实际的射流元件的失效过程及时间还有进一步分析的必要。
But it is still required to compute the practical courses and time of fluidic element's failure. - 我们引进了三个新概念,即广义转移概率,关键元件和失效风险。
Three new concepts, namely a generalized transition probability, the key component, and the failure risk, are introduced.
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