热载流子 [物] hot carrier
- 报道了用新的正向栅控二极管技术分离热载流子应力诱生的SOI- MOSFET界面陷阱和界面电荷的理论和实验研究。
The front gate interface and oxide traps induced by hot carrier stress in SOI NMOSFETs are studied. - 在热载流子应力条件下,器件的退化主要是由于在漏极附近由热载流子产生的损伤缺陷引起的。
Under hot carrier stress, device degradation is the consequence of hot carrier induced defect generation locally at drain side. - 本文对亚微米MOSFET在漏雪崩恒流应力(DAS)条件下热载流子注入引起的退变现象做了实验研究。
An experimental investigation on the hot carrier effects in N-channel submieronMOSFET's at drain avalanche stress (DAS) is presented.
您正在访问的是
中国词汇量第二的英语词典
更多精彩,登录后发现......