离子束分析 ion beam analysis
- 本文介绍了核辐射使电子元器件失效的机制以及离子束分析技术在抗核加固研究中的若干应用。
The mechanism of radiation damage effects on electronic devices and the applications of ion beam analysis in the investigations of radiation hardening were presented in this paper. - 分析了等离子束射流温度、密度、压力和速度场的空间分布特点以及它们之间的内在联系。
The spatial distribution characteristics of plasma flow temperature, density, pressure velocity field and intrinsic relation of them were completely analyzed. - 并对氢、氦、氮、氩等气体产生的离子束进行了磁分析,测定了离子束的质谱。
The hydrogen, helium, nitrogen and argon beams thus produced were analyzed and their mass spectra were measured.
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