集成电路测试器 [
jí chéng diàn lù cè shì qì]
[电子] integrated circuit tester
- 最后将错位相移器应用于集成电路硅片薄膜应力分布测试仪及错位电子散斑干涉仪之中。
This technic has been used in the instrument of IC wafer Stress Analyzer and Shear Electronic Speckle Pattern Interferometry(SESPI). - 为了降低开发超大规模集成电路器件的测试程序的费用,缩短开发周期,给出了一种设计和开发测试系统仿真器的基本思想、结构组成及其功能。
In order to reduce the cost of developing VLSI test program and shorten developing cycle, an idea of a simulator design of test system and gives the simulators structure and function is put up.